IC for Microchip EEPROM 2KBIT I2C

IC for Microchip EEPROM 2KBIT I2C

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Product Description

1. Product introduction of IC for microchip EEPROM 2KBIT I2C

The Microchip Technology Inc. 24AA024/24LC024/ 24AA025/24LC025 is a 2 Kbit Serial Electrically Erasable PROM with a voltage range of 1.7V to 5.5V. The device is organized as a single block of 256 x 8-bit memory with a 2-wire serial interface. Low current design permits operation with typical standby and active currents of only 1 μA and 1 mA, respectively. The device has a page write capability for up to 16 bytes of data. Functional address lines allow the connection of up to eight 24AA024/24LC024/ 24AA025/24LC025 devices on the same bus for up to 16K bits of contiguous EEPROM memory.

2. Product feature and application of IC for microchip EEPROM 2KBIT I2C

1).  Single Supply with Operation from 1.7V to 5.5V for 24AA024/24AA025 Devices, 2.5V for 24LC024/24LC025 Devices

2). Low-Power CMOS Technology: - Read current 1 mA, typical - Standby current 1 μA, typical

3). 2-Wire Serial Interface, I2C™ Compatible

4). Cascadable up to Eight Devices

5). Schmitt Trigger Inputs for Noise Suppression

6). Output Slope Control to Eliminate Ground Bounce

7). 100 kHz and 400 kHz Clock Compatibility

8). Page Write Time 5 ms Maximum

9). Self-timed Erase/Write Cycle

10). 16-Byte Page Write Buffer

11). Hardware Write-Protect on 24XX024 Devices

12). ESD Protection >4,000V

13). More than 1 Million Erase/Write Cycles

14). Data Retention >200 years

15). Factory Programming Available

16). Packages include 8-lead PDIP, SOIC, TSSOP, DFN, TDFN and MSOP

17). 6-Lead SOT-23 Package, 24XX025 only

18). Pb-Free and RoHS Compliant

19). Temperature Ranges: - Industrial (I): -40°C to +85°C - Automotive (E): -40°C to +125°C

3. Product Qualification of IC for microchip EEPROM 2KBIT I2C

Wing supports test-driven development with the unittest, doctest, nose, pytest, and Django testing frameworks. Failing tests are easy to diagnose and fix with Wing's powerful debugger, and you can write new code interactively in the live runtime context set up by a unit test.

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